SERS-active substrates based on thin silver films annealed at high temperatures: A comparative study by techniques of atomic-force microscopy and surface-enhanced raman scattering spectroscopy
SERS-active substrates based on thin silver films annealed at high temperatures: A comparative study by techniques of atomic-force microscopy and surface-enhanced raman scattering spectroscopy / S.A. Maskevicb, I.F. Sveklo, L.N. Kivach, A.V. Feofanov, A.I. Yanul', V.A. Oleinikov, S.P. Gromov, O.A. Fedorova, M.V. Alfimov, I.R. Nabiev // Optics and Spectroscopy. – 1996. – Т. 81. – № 1. – P. 83-90
